The 9th International Symposium on ADVANCED TOPICS IN ELECTRICAL ENGINEERING 2015

Papers Proceedings »

Investigating Resistance of Layers in Nickel Germanide Formed on Amorphous and Crystalline Germanium

Nickel germanide formed on amorphous and crystalline germanium was investigated for sheet resistance, resistivity and specific contact resistivity of Al to the NiGe layers. This paper reports on electrical characterization of NiGe using both c-Ge and a-Ge.

Author(s):

FAHID ALGAHTANI    
Electrical and Computer Engineering , RMIT University .
Australia

Anthony Holland    
Electrical and Computer Engineering , RMIT University .
Australia

Elena Pirogova    
Electrical and Computer Engineering , RMIT University .
Australia

 

Powered by OpenConf®
Copyright ©2002-2014 Zakon Group LLC